Quality Plane · Taxonomy

Defect
Taxonomy

33 expert-curated defect types from IPC-A-610G, SEMI E10, and ISO 9000-3. Every DRC violation, lot report, and CAPA recommendation in ChipletOS speaks this vocabulary, so quality teams at Absolics, DNP, Rapidus, Corning, and Intel can audit our outputs in their own language.

Total Codes

defect types

Families

IPC/SEMI groupings

Critical Tier

tier-1 defects

Glass-TGV Direct

directly applicable

Code	Name	Family	Tier	Detection	Standard	TGV Relevance
VOID_SOL	Solder Void	Solder Joint	Elevated	AXI	IPC-A-610G	indirect
BRIDGING	Solder Bridging	Solder Joint	Critical	AOI/AXI	IPC-A-610G	indirect
TOMBSTONE	Component Tombstone	Solder Joint	Critical	AOI	IPC-A-610G	n/a
COLD_JOINT	Cold Solder Joint	Solder Joint	Elevated	AXI/Electrical	IPC-A-610G	indirect
VOID_WIRE	Wire Bond Void	Wire Bond	Critical	SAM	IPC-A-610G	direct
OPEN_BOND	Open Wire Bond	Wire Bond	Critical	Optical/Electrical	IPC-A-610G	direct
CRACK_DIE	Die Crack	Die	Critical	Optical/SEM	SEMI E10	direct
SCRATCH_DIE	Die Surface Scratch	Die	Watch	Optical/SEM	SEMI E10	direct
OPEN_PCB	PCB Open Circuit	PCB Trace	Critical	AOI/Electrical	IPC-A-610G	indirect
SHORT_PCB	PCB Short Circuit	PCB Trace	Critical	AOI/Electrical	IPC-A-610G	indirect
MOUSEBITE	Mousebite PCB	PCB Trace	Elevated	AOI	IPC-A-610G	indirect
SPUR	Copper Spur	PCB Trace	Elevated	AOI	IPC-A-610G	indirect
PINHOLE	Pin Hole	PCB Trace	Elevated	AOI	IPC-A-610G	indirect
PATTERN_CTR	Center Wafer Pattern	Wafer Map	Elevated	Parametric	SEMI E10	direct
PATTERN_EDGE	Edge-Ring Wafer Pattern	Wafer Map	Elevated	Parametric	SEMI E10	direct
PATTERN_LOC	Local Wafer Cluster	Wafer Map	Elevated	Parametric	SEMI E10	direct
PATTERN_DONUT	Donut Wafer Pattern	Wafer Map	Elevated	Parametric	SEMI E10	direct
PATTERN_SCRATCH	Scratch Wafer Pattern	Wafer Map	Critical	Parametric	SEMI E10	direct
DELAM_PKG	Package Delamination	Package	Elevated	SAM	IPC-A-610G	direct
DELAM_BGA	BGA Delamination	BGA	Critical	AXI/SAM	IPC-A-610G	direct
WARP_PKG	Package Warpage	Package	Elevated	Shadow Moiré/CT	IPC-A-610G	direct
UNDERFILL_VOID	Underfill Void	Flip Chip	Elevated	SAM/CT	IPC-A-610G	direct
MISALIGN_DIE	Die Misalignment	Die Attach	Elevated	AOI	IPC-A-610G	direct
MISALIGN_BUMP	Bump Misalignment	Flip Chip	Elevated	SEM/X-Ray	IPC-A-610G	direct
CRACK_SUBS	Substrate Crack	Substrate	Critical	CT/Optical	IPC-A-610G	direct
SUBSTRATE_OPEN	Substrate Trace Open	Substrate	Critical	AOI/Electrical	IPC-A-610G	direct
DELAMTKL	Dielectric Stack Delamination	Stack	Critical	CT	IPC-A-610G	direct
CONTAM_PART	Particulate Contamination	Contamination	Watch	Optical	ISO 9000-3	direct
CONTAM_IONIC	Ionic Contamination	Contamination	Elevated	Ion Chromatography	ISO 9000-3	direct
WARP_WAFER	Wafer Warpage	Warpage	Watch	Wafer Bow	SEMI E10	direct
HILLOCK	Metal Hillock	Surface	Elevated	SEM	SEMI E10	direct
ELECTROMIG	Electromigration Void	Surface	Critical	SEM/TEM	SEMI E10	direct
TEXTURE_ANOM	Surface Texture Anomaly	Surface	Watch	AOI/Optical	ISO 9000-3	direct

Live queryable at GET /v1/defects/search with filters for family, severity tier, detection method, and free-text description. MCP tool equivalent: search_defects(...).

Defect Taxonomy

Defect
Taxonomy